Journal Papers
- 蔡篤銘、任柏澔、徐子桓, 2022,” 無瑕疵樣本之自編碼器神經網路於PCB表面瑕疵檢測,” 影像與識別 , Vol. 28, p.p.90-117
- Fan, S. K. S., Tsai, D. M., Jen, C. H., Hsu, C. Y., He, F., & Juan, L. T., 2021,” Data Visualization of Anomaly Detection in Semiconductor Processing Tools,” IEEE Transactions on Semiconductor Manufacturing, 35(2), 186-197.
- Tsai, D. M., Fan, S. K. S., & Chou, Y. H. ,2021,” Auto-annotated deep segmentation for surface defect detection,” IEEE Transactions on Instrumentation and Measurement, 70, 1-10.
- Du-Ming Tsai, Yi-Quan Huang and Wei-Yao Chiu, 2021,” Coffee plantation area recognition in satellite images using Fourier transform,” Measurement Science and Technology vol. 32 (Accept)
- Saul A. Reynoso Farnes; Du-Ming Tsai; Wei-Yao Chiu, 2021,” Autofocus Measurement for Electronic Components Using Deep Regression,”IEEE Transactions on Components, Packaging and Manufacturing Technology vol. 11 (Accept)
- Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou, 2020,” Auto-annotated deep segmentation for surface defect detection,”IEEE Transactions on Instrumentation and Measurement vol. 70, pp.115-127
- Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fe He, Chun-Chung Cheng, 2020,” Data-driven approach for fault detection and diagnostic in semiconductor manufacturing,”IEEE Transactions on Automation Science and Engineering vol. 17, pp.1925-1936.