Conference Papers

• D. M. Tsai, Yan-Hsin Tseng, 2018, "Defect inspection of liquid-crystal-display (LCD) panels in repetitive pattern images using 2D Fourier image reconstruction," The Fourteenth International Conference on Autonomic and Autonomous Systems, France.
• D. M. Tsai, Shu-Kai S. Fan, Chih-Hung Jen, Rui-Yu Huang and Kuan-Lung Chen, 2016, "Key parameter identification for faulty wafer detection using image processing," ICAS.
• D. M. Tsai, Wan-Ling Chen, 2018, "Segmentation of coffee plantation area in satellite image using Fourier feature," The 19th Asia-Pacific Industrial Engineering and Management Systems Conference, HK.
• Du-Ming Tsai, Wei-Yao Chiu, 2017, "Automated visual inspection of multicrystalline solar wafer using wavelet discrimination measure," The 18th Asia Pacific Industrial Engineering and Management Systems Conference, Indonesia.
• Du-Ming Tsai, I-Yung Chiang and Wei-Yao Chiu, 2016, "Optical-flow-based template matching for surface defect detection," International Congress on Engineering and Information (ICEAI 2016), Osaka, Japan.
• Du-Ming Tsai, Yi-Jun Xie, 2015, "Automatic Crack Detection in Textured Metal Surfaces Using Machine Vision," The 16th Asia Pacific Industrial Engineering and Management Science Conference(APIEMS 2015), Ho Chi Minh City, Vietnam.
• Du-Ming Tsai, Tzu-Hsun Tseng and Wei-Yao Chiu, 2015, "Surface defect detection in low-contrast images using basis image representation," IAPR International Conference on Machine Vision Applications, Tokyo, Japan.
• Du-Ming Tsai, Wei-Yao Chiu and Tzu-Hsun Tseng, 2015, "Moving object detection from a mobile robot using basis image matching," IS&T/SPIE Electronic Imaging 2015, San Francisco, USA.
• Du-Ming Tsai, Yan-Hsin Tseng and Wei-Yao Chiu, 2014, "Automatic defect inspection of TFT-LCD panels using Fourier image reconstruction," The 15th Asia Pacific Industrial Engineering and Management Science Conference(APIEMS 2014), Jeju, Korea.
• Du-Ming Tsai, Wei-Yao Chiu and Jie-Yu Luo, 2014, "Automatic visual inspection of solar wafers using mean-shift techniques," The Annual Conference on Engineering and Information Technology (ACEAIT 2014), Tokyo, Japan.
• Du-Ming Tsai, Shih-Chieh Wu and Wei-Yao Chiu, 2013, "Automatic visual inspection of solar modules using Independent component analysis," The 14th Asia Pacific Industrial Engineering and Management Science Conference(APIEMS 2013), Cebu, Philippines.
• Du-Ming Tsai, Wei-Yao Chiu, 2013, "A real-time ICA-based activity recognition in video sequences," MVA2013 (IAPR International Conference on Machine Vision Applications), Kyoto, Japan.
• Du-Ming Tsai, Wei-Yao Chiu, 2013, "Dual-mode Detection for Foreground Segmentation in Low-Contrast Video Images," VISIGRAPP2013 (8th Int’l. Joint Conf. on Computer Vision, Imaging and Computer Graphics Theory and Applications), Barcelona, Spain.
• Du-Ming Tsai, I-Yung Chiang, Hao Hsu and Wei-Yao Chiu, 2012, "A Shift-tolerant Dissimilarity Measure for Surface Defect Detection," The 13th Asia Pacific Industrial Engineering and Management Systems Conference, Phuket, Thailand.
• Du-Ming Tsai, Wei-Yao Chiu, and Ming-Chun Chen, 2012, "A PCA-based regularity measure for surface defect inspection," The Institute of Industrial Engineers Asian Conference, Singapore.
• Wei-Yao Chiu and Du-Ming Tsai, 2012, "ICA-based Action Recognition for Human-computer Interaction in Disturbed Backgrounds," 7th International Joint Conference on Computer Vision, Imaging and Computer Graphics Theory and Applications (VISIGRAPP 2012), Rome, Italy.
• Wei-Chen Li and Du-Ming Tsai, 2011, "Automatic Saw-Mark Detection in Multicrystalline Solar Wafer Images," The 12th Asia Pacific Industrial Engineering and Management Science Conference (APIEMS 2011), Beijing, China.
• S.M. Chao, D.M. Tsai, 2010, "Anisotropic diffusion-based detail-preserving smoothing for image restoration," Proceedings - International Conference on Image Processing, ICIP, pp. 4145-4148.
• Wei-Yao Chiu and Du-Ming Tsai, 2010, "A macro-observation approach of intelligence video surveillance for real-time unusual event detection," The 2010 International Symposium on Service, Security and its Data management technologies in Ubi-com (SSDU), Xi’an, China.
• Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li and Wei-Yao Chiu, 2010, "A generalized anisotropic diffusion for defect detection in low-contrast surfaces," 20th International Conference on Pattern Recognition(ICPR), Istanbul, Turkey.
• Shin-Min Chao, Du-Ming Tsai, Wei-Yao Chiu and Wei-Chen Li, 2010, "Anisotropic diffusion-based detail-preserving smoothing for image restoration," 2010 International Conference on Image Processing(ICIP), The Hong Kong Convention and Exhibition Centre, Hong Kong.
• Wei-Chen Li and Du-Ming Tsai, 2009, "Defect inspection in low-contrast LCD images using Hough transform-based non-stationary line detection," The 10th Asia Pacific Industrial Engineering and Management Science Conference (APIEMS 2009), Kokura, Japan.
• Du-Ming Tsai and Wei-Yao Chiu, 2009, "A Micro-observation Approach for Real-time Unusual Event Detection in Video," The 12th IEEE International Conference on Computer Vision (ICCV), Kyoto, Japan.
• Du-Ming Tsai, 2009, "Visual defect detection in low-contrast surfaces using anisotropic diffusion," Siberian-Taiwan-Forum Proceedings, Tomsk, Russia.
• Du-Ming Tsai, Yan-Jheng Su, and Wei-Yao Chiu, 2008, "Non-referential, self-compared shape defect inspection for PCB bond pads," The 9th Asia Pacific Industrial Engineering and Management Science Conference (APIEMS 2008), Bali, Indonesia.
• 蔡篤銘、蔡欣洋, 2008, "應用動態影像處理之光法於液晶顯示器面板之Mura瑕疵檢測," 中國工業工程學會九十七年度年會暨學術研討會，中原大學，中壢市。
• Wei-Chen Li, Du-Ming Tsai, Wei-Yao Chiu, and Ya-Hui Tsai, 2007, "Motion detection with a moving camera for mobile robot surveillance," Proceedings of the 8th Asia Pacific Industrial Engineering & Management System and 2007 Chinese Institute of Industrial Engineers Conference (APIEMS & CIIE Conference 2007), Kaohsiung, Taiwan.
• Du-Ming Tsai, Su-Ta Chuang, Yan-Hsin Tseng, 2006, "Automatic defect inspection of patterned TFT-LCD panels using Fourier image reconstruction," The International Conference on Industrial Engineering Theory, Application and Practice (IJIE), Nagoya, Japan.
• Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng and Yuan-Ruei Jhang, 2006, "Defect detection in low-contrast glass substrates using anisotropic diffusion," The 18th International Conference on Pattern Recognition (ICPR), Hong Kong.
• Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao and Chao-Hsuan Yen, 2006, "Independent component analysis based filter design for defect detection in low-contrast textured images," The 18th International Conference on Pattern Recognition (ICPR), Hong Kong.
• Shin-Min Chao, Du-Ming Tsai and Ya-Hui Tsai, 2006, "Independent component analysis based motion detection for indoor surveillance," The 36th International Conference on Computers and Industrial Engineering (CIE), Taipei, Taiwan.
• Chi-Jie Lu, Du-Ming Tsai, Chih-Chou Chiu and Yan-Hsin Tseng, 2006, "Independent component analysis based disturbance separation for statistical process control," The 36th International Conference on Computers and Industrial Engineering (CIE), Taichung, Taiwan.
• 曾彥馨、蔡篤銘, 2005, "Using independent component analysis based process monitoring in TFT-LCD manufacturing," 中國工業工程學會九十四年度年會暨學術研討會，中華大學，新竹市。
• 趙新民、蔡篤銘, 2005, "An anisotropic diffusion-based defect detection for low-contrast LCD glass substrates," 中國工業工程學會九十四年度年會暨學術研討會，中華大學，新竹市。
• 蔡篤銘、呂奇傑、林品杰, 2005, "應用獨立成份分析濾波器於TFT-LCD面板之瑕疵檢測," 中國工業工程學會九十四年度年會暨學術研討會，中華大學，新竹市。
• Shin-Min Chao and Du-Ming Tsai, 2005, "An anisotropic diffusion-based defect detection for backlight panels," 6th Asia Pacific Industrial Engineering and Management Science Conference, Manila, Philippines.
• Du-Ming Tsai, Chi-Jie Lu, Ping-Chieh Lin and Yan-Hsin Tseng, 2005, "Defect detection of backlight panel surfaces using independent component analysis filtering scheme," 6th Asia Pacific Industrial Engineering and Management Science Conference, Manila, Philippines.
• 趙新民、蔡篤銘, 2005, "Astronomical image restoration using anisotropic diffusion," 第四屆資訊與管理應用研討會，元培技術學院，新竹市。
• Yan-Hsin Tseng and Du-Ming Tsai, 2005, "Using Independent Component Analysis for Process Monitoring in TFT-LCD Manufacturing," The 3rd ANQ Congress & The 19th Asia Quality Symposium, Taipei, Taiwan, September 20-23.
• 蔡篤銘、林品杰、曾彥馨, 2005, "應用獨立成份分析濾波器於背光板與TFT-LCD面板之瑕疵檢測," 第五屆全國AOI論壇與展覽，交通大學，新竹市。
• Chi-Jie Lu and Du-Ming Tsai, 2004, "Defect Detection of Patterned TFT-LCD Surfaces Using Independent Component Analysis," 中國工業工程學會九十三年度年會暨學術研討會，成功大學，台南市。
• Chi-Jie Lu and Du-Ming Tsai, 2004, "Defect Inspection of Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD," The Fifth Asia-pacific conference on Industrial Engineering and Management Systems, Gold Coast, Australia, December 12-15.
• 曾彥馨、蔡篤銘, 2004, "應用機器視覺於TFT面板之表面瑕疵檢測與分類," 第四屆全國AOI論壇與展覽，交通大學，新竹市。
• 江行全、蔡篤銘、呂奇傑、朱建政、楊程翔, 2004, "應用機器視覺技術於臂章圖形之自動邊界偵測," 第四屆全國AOI論壇與展覽，交通大學，新竹市。
• 趙新民、蔡篤銘, 2003, "應用非線性擴散於非同質性紋路之濺鍍玻璃基板表面檢測," 中國工業工程學會九十二年度年會暨學術研討會，建國科技大學，彰化市。
• Chi-Jie Lu, Du-Ming Tsai and Hsu-Nan Yen, 2002, "Automatic Defect Inspection for LCDs Using Singular Value Decomposition," The Fourth Asia-pacific conference on Industrial Engineering and Management Systems, Taipei, Taiwan, December 18-22.
• Hsu-Nan Yen and Du-Ming Tsai, 2002, "An adaptive machine vision system for electronic components inspection," Proceedings of IE&EM’2002 & IceCE’2002 and Enterprise Management (IE&EM’2002), RID215, 1-8, Beijing, China.
• 蔡篤銘、顏旭男及謝坤翰, 2001, "應用準確白光相移技術於BGA共平面之檢測," 中國工業工程學會學術研討會，義守大學，高雄縣。
• 蔡篤銘、顏旭男及謝坤翰, 2001, "應用白光相位移技術於BGA高度之檢測," 2001年PCB製造技術研討會，元智大學，中壢市。
• Du-Ming Tsai and Chi-Hao Yeh, 2000, "Ball Grid Array (BGA) substrate inspection by 1-D wavelet-transform," The 5th Annual International Conference on Industrial Engineering – Theory, Applications and Practice.
• Du-Ming Tsai and B. Hsiao, 2000, "Defect detection using wavelet reconstruction," The 13th IPPR Conference on Computer Vision, Graphics and Image Processing, 2000.
• Du-Ming Tsai and S. K. Wu, 1999, "Automated surface inspection using Gabor filters," 12th IPPR Conference on Computer Vision, Graphics and Image Processing.