Journal Paper

• 蔡篤銘、任柏澔、徐子桓 (2022), “無瑕疵樣本之自編碼器神經網路於PCB表面瑕疵檢測,” 影像與識別, Vol. 28, pp. 90-117.
• Fan, S. K. S., Tsai, D. M., Jen, C. H., Hsu, C. Y., He, F., & Juan, L. T. (2021), “Data Visualization of Anomaly Detection in Semiconductor Processing Tools,” IEEE Transactions on Semiconductor Manufacturing, Vol. 35, No. 2, pp. 186-197.
• Tsai, D. M., Fan, S. K. S., & Chou, Y. H. (2021), “Auto-annotated deep segmentation for surface defect detection,” IEEE Transactions on Instrumentation and Measurement, Vol. 70, pp. 1-10.
• Du-Ming Tsai, Yi-Quan Huang and Wei-Yao Chiu (2021), “Coffee plantation area recognition in satellite images using Fourier transform,” Measurement Science and Technology, Vol. 32 (Accepted).
• Saul A. Reynoso Farnes, Du-Ming Tsai, Wei-Yao Chiu (2021), “Autofocus Measurement for Electronic Components Using Deep Regression,” IEEE Transactions on Components, Packaging and Manufacturing Technology, Vol. 11 (Accepted).
• Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou (2020), “Auto-annotated deep segmentation for surface defect detection,” IEEE Transactions on Instrumentation and Measurement, Vol. 70, pp. 115-127.
• Shu-Kai S. Fan, Chia-Yu Hsu, Du-Ming Tsai, Fe He, Chun-Chung Cheng (2020), “Data-driven approach for fault detection and diagnostic in semiconductor manufacturing,” IEEE Transactions on Automation Science and Engineering, Vol. 17, pp. 1925-1936.
• D. M. Tsai, Y. H. Chou (2020), “Fast and precise positioning in PCBs using deep neural network regression,” IEEE Transactions on Instrumentation and Measurement, Vol. 69, pp. 4692-4701.
• D. M. Tsai, C. K. Huang (2019), “Defect detection in electronic surfaces using template-based Fourier image reconstruction,” IEEE Transactions on Components, Packing, and Manufacturing Technology, Vol. 9, pp. 163-172.
• S.-K. Fan, D.-M. Tsai, F. He, R.-Y. Huang, C.-H. (2019), “Key parameter identification and defective wafer detection of semiconductor manufacturing processes using image processing techniques,” IEEE Transactions on Semiconductor Manufacturing, Vol. 32, pp. 544-552.
• D. M. Tsai, Daniel E. Rivera Molina (2019), “Morphology-based defect detection in machined surfaces with circular tool-mark patterns,” Measurement, Vol. 134, pp. 209-217.
• D. M. Tsai, Y. C. Hsieh (2018), “Machine vision-based positioning and inspection using expectation-maximization technique,” IEEE Transactions on Instrumentation and Measurement, Vol. 66, pp. 2585-2868.
• D. M. Tsai, W. L. Chen (2017), “Coffee plantation area recognition in satellite images using Fourier transform,” Computers and Electronics in Agriculture, Vol. 135, pp. 115-127.
• D. M. Tsai, Y. C. Hsieh (2017), “Machine Vision-Based Positioning and Inspection Using Expectation-Maximization Technique,” IEEE Transactions on Instrumentation and Measurement, Vol. 66, pp. 2858-2868.
• D. M. Tsai, G. N. Li, W. C. Li and W. Y Chiu (2015), “Defect detection in multi-crystal solar cells using clustering with uniformity measures,” Advanced Engineering Informatics, Vol. 29, pp. 419-430.
• D. M. Tsai, W. Y. Chiu and M. H. Lee (2015), “Optical flow-motion history image (OF-MHI) for action recognition,” Signal, Image and Video Processing, Vol. 9, pp. 1897-1906.
• D. M. Tsai, H. Hsu and W. Y. Chiu (2014), “3-D vision-assist guidance for robots or the visually impaired,” Industrial Robot: An International Journal, Vol. 4, pp. 351-364.
• D. M. Tsai, and W. Y. Chiu (2014), “Action performance evaluation in video sequences,” Imaging Science Journal, Vol. 62, pp. 358-364.
• D. M. Tsai, C. Y. Hung (2014), “A motion and image analysis method for automatic detection of estrus and mating behavior in cattle,” Computers and Electronics in Agriculture, Vol. 104, pp. 25-31.
• D. M. Tsai, M. C. Lin (2013), “Machine-vision-based identification for wafer tracking in solar cell manufacturing,” Robotics and Computer Integrated Manufacturing, Vol. 29, pp. 312–321.
• D. M. Tsai, T. H. Tseng (2013), “A template reconstruction scheme for moving object detection from a mobile robot,” Industrial Robot: An International Journal, Vol. 40, pp. 559-573.
• D. M. Tsai, S. C. Wu and W. Y. Chiu (2013), “Defect Detection in Solar Modules Using ICA Basis Images,” IEEE Transactions on Industrial Informatics, Vol. 9, pp. 122-131.
• W. Y. Chiu and D. M. Tsai (2013), “Moving/motionless foreground object detection using fast statistical background updating,” Imaging Science Journal, Vol. 61, pp. 252-267.
• W. C. Li and D. M. Tsai (2012), “Wavelet-based defect detection in solar wafer images with inhomogeneous texture,” Pattern Recognition, Vol. 45, pp. 742-756.
• D. M. Tsai, S. C. Wu, W. C. Li (2012), “Defect detection of solar cells in electroluminescence images using Fourier image reconstruction,” Solar Energy Materials & Solar Cells, Vol. 99, pp. 250-262.
• D. M. Tsai, M. C. Chen, W. C. Li, W. Y. Chiu (2012), “A fast regularity measure for surface defect detection,” Machine Vision and Applications, Vol. 23, pp. 869-886.
• D. M. Tsai, I. Y. Chiang, and Y. H. Tsai (2012), “A shift-tolerant dissimilarity measure for surface defect detection,” IEEE Transactions on Industrial Informatics, Vol. 8, pp. 128-137.
• W. C. Li and D. M. Tsai (2011), “Automatic saw-mark detection in multicrystalline solar wafer images,” Solar Energy Materials and Solar Cells, Vol. 95, pp. 2206-2220.
• W. C. Li and D. M. Tsai (2011), “Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection,” IEEE Transactions on Industrial Informatics, Vol. 7, pp. 136-147.
• D. M. Tsai and C. C. Lin (2011), “Fuzzy C-means based clustering for linearly and nonlinearly separable data,” Pattern Recognition, Vol. 44, pp. 1750-1760.
• D. M. Tsai and J. Y. Luo (2011), “Mean shift-based defect detection in multicrystalline solar wafer surfaces,” IEEE Transactions on Industrial Informatics, Vol. 7, pp. 125-135.
• Y. H. Tsai, D. M. Tsai, W. C. Li, W. Y. Chiu and M. C. Lin (2011), “Surface defect detection of 3D objects using robot vision,” Industrial Robot, Vol. 38, pp. 381-398.
• D. M. Tsai and H. Y. Tsai (2011), “Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis,” Machine Vision and Applications, Vol. 22, pp. 629-649.
• S. M. Chao and D. M. Tsai (2010), “An improved anisotropic diffusion model for detail- and edge-preserving smoothing,” Pattern Recognition Letters, Vol. 31, pp. 2012-2023.
• W. Y. Chiu and D. M. Tsai (2010), “A macro-observation scheme for abnormal event detection in daily-life video sequences,” EURASIP Journal on Advances in Signal Processing, Vol. 2010, Article ID 525026, 19 pages.
• S. M. Chao and D. M. Tsai (2010), “Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images,” Pattern Recognition, Vol. 43, pp. 1917-1931.
• D. M. Tsai, C. C. Chang, and S. M. Chao (2010), “Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion,” Image and Vision Computing, Vol. 28, pp. 491-501.
• Y. H. Tseng and D. M. Tsai (2010), “Defect detection of uneven brightness in low-contrast images using basis image representation,” Pattern Recognition, Vol. 43, pp. 1129-1141.
• D. M. Tsai and Y. J. Su (2009), “Non-referential, self-compared shape defect inspection for bond pads with deformed shapes,” International Journal of Production Research, Vol. 47, pp. 1225-1244.
• D. M. Tsai and S. C. Lai (2009), “Independent component analysis-based background subtraction for indoor surveillance,” IEEE Transactions on Image Processing, Vol. 18, pp. 158-167.
• D. M. Tsai and W. Y. Chiu (2008), “Motion detection using Fourier image reconstruction,” Pattern Recognition Letters, Vol. 29, pp. 2145-2155.
• H. N. Yen, D. M. Tsai and S. K Feng (2008), “Full-field 3D flip-chip solder bumps measurement using DLP-based phase shifting technique,” IEEE Transactions on Advanced Packaging, Vol. 31, pp. 830-840.
• D. M. Tsai and S. T. Chuang (2008), “1D-based defect detection in patterned TFT-LCD panels using characteristic fractal dimension and correlations,” Machine Vision and Applications, Vol. 20, pp. 423-434.
• D. M. Tsai and S. C. Lai (2008), “Defect detection in periodically patterned surfaces using independent component analysis,” Pattern Recognition, Vol. 41, pp. 2812-2832.
• S. M. Chao and D. M. Tsai (2008), “An anisotropic diffusion-based defect detection for low-contrast glass substrates,” Image and Vision Computing, Vol. 26, pp. 187-200.
• C. J. Lu and D. M. Tsai (2008), “Independent component analysis-based defect detection in patterned liquid crystal display surfaces,” Image and Vision Computing, Vol. 26, pp. 955-970.
• D. M. Tsai and C. C. Kuo (2007), “Defect detection in homogeneously textured sputtered surfaces using 3D Fourier image reconstruction,” Machine Vision and Applications, Vol. 18, pp. 383-400.
• D. M. Tsai, S. T. Chuang and Y. H. Tseng (2007), “One-dimensional based automatic defect inspection of multiple patterned TFT-LCD panels using Fourier image reconstruction,” International Journal of Production Research, Vol. 45, pp. 1297-1321.
• D. M. Tsai, P. C. Lin and C. J. Lu (2006), “An independent component analysis-based filter design for defect detection in low-contrast surface images,” Pattern Recognition, Vol. 39, pp. 1679-1694.
• S. M. Chao and D. M. Tsai (2006), “Astronomical image restoration using an improved anisotropic diffusion,” Pattern Recognition Letters, Vol. 27, pp. 335-344.
• H. N. Yen, D. M. Tsai and J. Y. Yang (2006), “Full-field 3D measurement of solder pastes using LCD-based phase shifting techniques,” IEEE Transactions on Electronics Packaging Manufacturing, Vol. 29, pp. 50-57.
• Y. H. Tseng and D. M. Tsai (2006), “Using independent component analysis based process monitoring in TFT-LCD manufacturing,” Journal of the Chinese Institute of Industrial Engineers, Vol. 23, pp. 262-267.
• D. M. Tsai and R. H. Yang (2005), “An eigenvalue-based similarity measure and its application in defect detection,” Image and Vision Computing, Vol. 23, pp. 1094-1101.
• D. M. Tsai and C. H. Yang (2005), “A quantile-quantile plot based pattern matching for defect detection,” Pattern Recognition Letters, Vol. 26, pp. 1948-1962.
• D. M. Tsai and C. Y. Hung (2005), “Automatic defect inspection of patterned TFT-LCD panels using 1-D Fourier reconstruction and wavelet decomposition,” International Journal of Production Research, Vol. 43, pp. 4589-4607.
• D. M. Tsai, C. P. Lin and K. T. Huang (2005), “Defect detection in colored texture surfaces using Gabor filters,” The Imaging Science Journal, Vol. 53, pp. 27-37.
• D. M. Tsai and S. M. Chao (2005), “An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures,” Image and Vision Computing, Vol. 23, pp. 325-338.
• C. J. Lu and D. M. Tsai (2005), “Automatic defect inspection for LCDs using singular value decomposition,” International Journal of Advanced Manufacturing Technology, Vol. 25, pp. 53-61.
• E. Zahara, S. K. S. Fan, and D. M. Tsai (2005), “Optimal multi-thresholding using a hybrid optimization approach,” Pattern Recognition Letters, Vol. 26, pp. 1082-1095.
• C. J. Lu and D. M. Tsai (2004), “Defect inspection of patterned TFT-LCD panels using a fast sub-image based SVD,” International Journal of Production Research, Vol. 42, pp. 4331-4351.
• H. N. Yen and D. M. Tsai (2004), “A fast full-field 3D measurement system for BGA coplanarity inspection,” International Journal of Advanced Manufacturing Technology, Vol. 24, pp. 132-139.
• D. M. Tsai, C. T. Lin and J. F. Chen (2003), “The evaluation of normalized cross correlations for defect detection,” Pattern Recognition Letters, Vol. 24, pp. 2525-2535.
• D. M. Tsai and C. T. Lin (2003), “Fast normalized cross correlation for defect detection,” Pattern Recognition Letters, Vol. 24, pp. 2625-2631.
• D. M. Tsai and T. Y. Huang (2003), “Automated surface inspection for statistical textures,” Image and Vision Computing, Vol. 21, pp. 307-323.
• D. M. Tsai and C. H. Chiang (2003), “Automatic band selection for wavelet reconstruction in the application of defect detection,” Image and Vision Computing, Vol. 21, pp. 413-431.
• D. M. Tsai and C. C. Chou (2003), “A fast focus measure for video display inspection,” Machine Vision & Applications, Vol. 14, pp. 192-196.
• K. H. Hsiehn and D. M. Tsai (2003), “A fast optical mouse inspection technique using Voronoi diagrams,” Pattern Recognition Letters, Vol. 24, pp. 2087-2094.
• D. M. Tsai, and M. C. Chen (2002), “Facial image database indexing based on singular value decomposition and projection image matching,” Journal of Visual Communication and Image Representation, Vol. 13, pp. 233-244.
• D. M. Tsai, and C. T. Lin (2002), “Fast normalized cross correlation for defect detection,” IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 24, pp. 935-947.
• W. T. Lu and D. M. Tsai (2002), “On-line measurement for the roughness of machined surfaces using 1-D Fourier transforms,” Journal of Manufacturing Systems, Vol. 21, pp. 161-170.
• D. M. Tsai and S. H. Lee (2001), “A low-contrast defect detection method using two approaches for automatic surface inspection,” Pattern Recognition Letters, Vol. 22, pp. 1225-1244.
• D. M. Tsai and M. C. Chen (2001), “Robust industrial inspection using gray-based multiresolution image matching,” Image and Vision Computing, Vol. 19, pp. 1249-1259.
• D. M. Tsai and S. T. Yeh (2000), “A genetic algorithm-based clustering approach for defect detection in textured surfaces,” Journal of Visual Communication and Image Representation, Vol. 11, pp. 13-33.